The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 19, 2004

Filed:

Jul. 24, 2001
Applicant:
Inventors:

Henning Biermann, New York, NY (US);

Ioana Martin, Pelham Manor, NY (US);

Denis Zorin, New York, NY (US);

Fausto Bernardini, New York, NY (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06T 1/700 ;
U.S. Cl.
CPC ...
G06T 1/700 ;
Abstract

A method for representing a sharp feature on a surface of a model comprises the steps of defining at least one feature curve on the surface; reparameterizing the surface; and creating the feature on the reparameterized surface so as to be generally coincident with the feature curve, where the feature lies along boundaries between piecewise-smooth patch surfaces where patch surfaces with distinct tangent planes are joined. The surface is reparameterized by moving a control mesh relative to the surface to sample the feature curve with vertices of the control mesh, and creating the feature includes a subdivision step where edges and diagonals are treated as creases in the control mesh, and piecewise-smooth subdivision rules are applied to obtain a sharp feature on the surface. The surface may be defined in a Catmull-Clark multiresolution subdivision surface representation.


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