The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 19, 2004
Filed:
Aug. 30, 2001
James A. Ringlien, Maumee, OH (US);
John W. Juvinall, Ottawa Lake, MI (US);
Owens-Brockway Glass Container Inc., Toledo, OH (US);
Abstract
Apparatus for measuring sidewall thickness of a container includes a conveyor for moving the container transversely of its axis through an inspection station and simultaneously rotating the container about its axis. A light source and an illumination lens system direct onto the sidewall of the container a line-shaped light beam having a long dimension perpendicular to the axis of the container and parallel to the direction of movement of the container through the inspection station. A light sensor and an imaging lens system direct onto the sensor light energy reflected from portions of the outer and inner sidewall surfaces that are perpendicular to the illumination light energy. An information processor is responsive to light energy directed onto the light sensor by the imaging lens system for determining the thickness of the container between the outer and inner sidewall surfaces.