The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 19, 2004

Filed:

Oct. 03, 2001
Applicant:
Inventors:

Rune Wendelbo, Oslo, NO;

Duncan E. Akporiaye, Oslo, NO;

Ivar M. Dahl, Oslo, NO;

Arne Karlsson, Oslo, NO;

Gregory J. Lewis, Mount Prospect, IL (US);

David S. Bem, Arlington Heights, IL (US);

Andrzej Z. Ringwelski, Marengo, IL (US);

Richard C. Murray, Jr., Palatine, IL (US);

Cheryl M. Surman, Albany, NY (US);

Assignee:

UOP LLC, Des Plaines, IL (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
B01L 3/00 ; G01N 1/00 ; G01N 2/320 ; C12M 3/00 ; C12M 1/23 ;
U.S. Cl.
CPC ...
B01L 3/00 ; G01N 1/00 ; G01N 2/320 ; C12M 3/00 ; C12M 1/23 ;
Abstract

An apparatus and process for forming an array of powder samples arranged in predefined locations where all samples have a flat surface in a common plane has been developed. A monolithic block having a main support section having at least N perforations from a first surface of the main support through a second surface of the main support in predefined locations, where N is the number of samples in the array is provided. The monolithic block also has a flat support section covering the perforations of the main support section. All N samples are loaded simultaneously with sample X in perforation X of the main support where X is an integer from 1 to N. A flat surface of each sample where the flat surfaces are a common plane is formed by forcing the samples within the perforations against the flat support. The samples are retained in position within the perforations against the flat support, and are made ready for analysis since the flat surfaces of the samples are in predefined locations and are all in a common plane.


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