The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 19, 2004

Filed:

Mar. 19, 2001
Applicant:
Inventors:

Motoyasu Terao, Hinode, JP;

Makoto Miyamoto, Ome, JP;

Yasushi Miyauchi, Akishima, JP;

Keikichi Ando, Musashino, JP;

Yumiko Anzai, Ome, JP;

Junko Ushiyama, Kokubunji, JP;

Reiji Tamura, Moriya, JP;

Yoshihiro Ikari, Moriya, JP;

Tamotsu Fuchioka, Moriya, JP;

Assignee:

Other;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G11B 7/24 ;
U.S. Cl.
CPC ...
G11B 7/24 ;
Abstract

In an optical disk for high density recording, for preventing the deformation of recording tracks caused by stress which may develop between the substrate and the recording stacked film formed thereon, a stress-compensation layer having a metal element such as Ti or Cr as a main component is provided. The stress-compensation layer undergoes contraction (tensile stress) to compensate for compression stress which develops in the stacked film during cooling after the thermal expansion of the substrate surface that occurs at the end of film formation. The stress-compensation layer has a pillar-like structure which, starting from the lower face, reaches the upper face of the film.


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