The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 19, 2004

Filed:

Jan. 30, 2002
Applicant:
Inventors:

Ross K. MacHattie, Snellville, GA (US);

Edward Belotserkovsky, San Francisco, CA (US);

Assignee:

Honeywell International Inc., Morristown, NJ (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
B05D 3/00 ;
U.S. Cl.
CPC ...
B05D 3/00 ;
Abstract

A system and method for processing measurements of a coating operation of a moving web, such as paper or plastic. A plurality of sensors are deployed at essentially the same cross direction (CD) locations and at different machine directions (MD) of the web. A measurement processor produces a plurality of measurement signal samples for each of the MD locations. The system also includes a computer that processes the signal samples produced by the measurement processor with correction data obtained from a quality control system and a distributed processing system. The signal samples of all the locations are combined to produce an MD profile of a characteristic of the web, such as moisture content, temperature, coating weight, drying rate and the like. The MD profile is adjusted with the correction data, which includes parameters, such as, dryer air temperature, dryer air pressure, web speed, base paper, coating formulation, coating weight, incoming moisture level, outgoing moisture level and infrared energy.


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