The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 19, 2004
Filed:
Jan. 17, 2002
Applicant:
Inventors:
Hiroaki Furuichi, Yokohama, JP;
Kazumi Kawamoto, Yokohama, JP;
Katsumi Kuroguchi, Yokohama, JP;
Keiichi Yamada, Yokohama, JP;
Shintarou Sakamoto, Fujisawa, JP;
Assignee:
OpNext Japan, Inc., Tokyo, JP;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G02B 6/36 ;
U.S. Cl.
CPC ...
G02B 6/36 ;
Abstract
The incident angle of the beam with regard to an etalon is arranged finely tunable by either rotating the etalon provided with a plane of incidence inclined with regard to the rotational axis thereof in the vicinity of the optical axis or rotating a lens whose edge surface is obliquely ground around the optical axis, which allows the incident angle of the laser beam with regard to the etalon to be adjusted and fixed with high precision.