The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 19, 2004

Filed:

Jul. 05, 2002
Applicant:
Inventors:

Miwako Torii, Toyohashi, JP;

Setsuo Saito, Aichi-gun, JP;

Assignee:

Nidek Co., Ltd., Gamagori, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
A61B 3/10 ; A61B 3/00 ;
U.S. Cl.
CPC ...
A61B 3/10 ; A61B 3/00 ;
Abstract

The present invention intends to provide an apparatus for analyzing a sectional image of an anterior eye segment and a program for the same which reduce a burden on an examiner, and to provide a more reliable, reproducible result. The apparatus for analyzing a sectional image of an anterior eye segment which is light-sectioned by slit light and photographed comprises a defining device for defining a target opacity part in the sectional image based on a density distribution being between a cornea and a fundus and being in a first direction perpendicular to an optical axis of an eye to be examined, a determining device for determining an area to be analyzed based on the defined opacity part, and an analyzing device for analyzing an opacity condition base on the density distribution in the determined area.


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