The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 12, 2004
Filed:
Aug. 14, 2001
David G. Bellemore, Fairfield, CT (US);
David R. Fournier, Hudson, MA (US);
Michael A. Davis, Glastonbury, CT (US);
CiDRA Corporation, Wallingford, CT (US);
Abstract
A method and corresponding apparatus for determining the centroid (V ) of a waveform signal being sampled at a set of parameter values (V , i=1, . . . , n) yielding a corresponding set of sampled amplitudes (A , i=1, . . . , n), each parameter value and corresponding amplitude forming a sampled point (V , A ), the method including the steps of: selecting an amplitude at which to create an interpolated point; interpolating a first parameter value corresponding to the amplitude selected in the step of selecting an amplitude; and performing a centroid calculation using only the sampled points with an amplitude greater than a predetermined threshold. The waveform is sometimes sampled in the presence of background noise, and the method sometimes also includes: estimating the background (B ) for each value in the set of parameter values at which sampling is performed; and reducing the amplitude (A ) of each sampled amplitude by the background (B ) so estimated.