The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 12, 2004

Filed:

Jun. 20, 2000
Applicant:
Inventors:

Naoyuki Tokuda, Kokubunji, JP;

Hiroyuki Sasai, Fussa, JP;

Assignee:

Sunflare Co., Ltd., Tokyo, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 1/728 ;
U.S. Cl.
CPC ...
G06F 1/728 ;
Abstract

To retrieve an optimum template pattern in response to an input sentence, a set of templates is arranged in a plurality of template blocks containing an arbitrary number of sentence components, including grammatically correct and/or incorrect components. A score is assigned to every word in the set of templates according to its importance. The candidate template patterns and the input sentence are retrieved, the scores of the matched words are calculated, and the total of the scores of the entire paths are calculated. Optimum level comparison values are then calculated using the score of the matching words as the numerator and the total score as the denominator. The candidate template pattern having the largest optimum level comparison value among optimum level comparison values that provide the largest numerator, is selected as the optimum template pattern. The input sentence is then corrected using this optimum template pattern.


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Tokuda, Naoyuki. (2004). Method, apparatus, and recording medium for retrieving optimum template pattern (U.S. Patent No. 6804637). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/6804637

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