The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 12, 2004

Filed:

Feb. 17, 2000
Applicant:
Inventors:

Gerard J. Holzmann, Watchung, NJ (US);

Margaret H. Holzmann, Watchung, NJ (US);

James J. Striegel, Little Silver, NJ (US);

Mihalis Yannakakis, Summit, NJ (US);

Assignee:

Lucent Technologies Inc., Murray Hill, NJ (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 1/750 ; G06F 1/710 ; G06F 1/100 ;
U.S. Cl.
CPC ...
G06F 1/750 ; G06F 1/710 ; G06F 1/100 ;
Abstract

A method and apparatus for generating a covering set of test cases from a directed graph is provided. The directed graph includes nodes and edges connecting the nodes, and a test case is a path through the directed graph. To generate a partial set of test cases, a set of selected test cases is received. These test cases can be manually selected or they can be a maintained test case set. The edges or nodes on the directed graph (or requirements linked to nodes or edges) that are covered by the selected test cases are marked with an identifier. Test cases are then generated from the directed graph according to a coverage algorithm. Marked graph elements may, but need not, be included in the generated test cases. The resulting partial test case set together with the selected test cases satisfy the coverage criterion.


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