The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 12, 2004

Filed:

Jul. 27, 2001
Applicant:
Inventor:

John Bryant, Dallas, TX (US);

Assignee:

Other;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01V 3/02 ;
U.S. Cl.
CPC ...
G01V 3/02 ;
Abstract

A method is provided for detecting and locating anomalies in soil subjacent to an existing structure. Electrodes are placed into the soil both outside the structure and through the structure's foundation. Electrical resistivity data is collected using these electrodes. This electrical resistivity data is analyzed to create an electrical resistivity map or model. Inspection of the map or model can allow the operator to detect and locate resistivity anomalies which may correspond to geological anomalies in the soil. In alternative embodiment, one or more soil samples are taken from the soil adjacent to the existing structure. Laboratory resistivity measurements are performed on the soil samples to provide a set of baseline resistivity data. A resistivity map or model is produced as described above. This resistivity map or model is compared to the baseline values provided by the laboratory resistivity measurements of the soil samples to detect and locate resistivity and geological anomalies. Moreover, comparison of the resistivity model with the actual soil sample resistivity baseline allows the operator to more accurately detect subsurface anomalies by minimizing the problem of non-uniqueness and allowing the operator to disregard outlying data.


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