The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 12, 2004
Filed:
May. 18, 2000
Applicant:
Inventors:
Dimitrios Ioannou, Fremont, CA (US);
Jonathan Apollo Kung, Oakland, CA (US);
Christopher Robin Thewalt, Oakland, CA (US);
Mark Damon Wheeler, Oakland, CA (US);
Assignee:
Leica Geosystems HDS, Inc., San Ramon, CA (US);
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06K 9/00 ; G06K 9/62 ; G06K 9/36 ;
U.S. Cl.
CPC ...
G06K 9/00 ; G06K 9/62 ; G06K 9/36 ;
Abstract
An apparatus and method are described for acquiring tie-point target locations on a structure that eliminates the need for the user to manually identify features that can be used to register multiple scenes so that they share a single coordinate system. In the present invention, readily identifiable objects, known as targets, are placed on or near the structure. When the structure is scanned, the targets are identified and can then be used in other operations, such as registration.