The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 12, 2004
Filed:
Nov. 01, 2001
Toshitaka Amano, Tochigi, JP;
Canon Kabushiki Kaisha, Tokyo, JP;
Abstract
An exposure apparatus for projecting a pattern on a reticle onto a substrate via projection optics to expose the substrate to the pattern. The apparatus includes a focus detection system for detecting focus of the projection optics, a barometer for measuring at least one of atmospheric pressure and ambient air pressure within the apparatus, a calibration device for calibrating the focus detection system, and a correction device. The correction device acquires a correction quantity, for correcting for a change in an image-formation characteristic ascribable to a fluctuation in air pressure of the projection optics, based upon a result of a measurement performed by the barometer during execution of the calibration, and corrects operation of the calibration device using the correction quantity.