The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 12, 2004

Filed:

Apr. 26, 2000
Applicant:
Inventors:

Masahiro Ohishi, Tokyo-to, JP;

Mitsuru Kanokogi, Tokyo-to, JP;

Assignee:

Kabushiki Kaisha TOPCON, Tokyo-to, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 2/186 ;
U.S. Cl.
CPC ...
G01N 2/186 ;
Abstract

A distance measuring system, which comprises a control arithmetic unit , a light emitting unit for emitting a measuring light beam and a photodetection unit for receiving a reflection light beam from an object to be measured, the system being used for measuring a distance by receiving the reflection light beam from the object to be measured, wherein the control arithmetic unit compares a signal based on the photodetection amount of the reflection light from the object to be measured as well as a result of the distance measurement with reference data prestored in the control arithmetic unit relating to the reflection of the object to be measured, and judges whether the object to be measured is a prism or a natural object based on a result of the comparison.


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