The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 12, 2004
Filed:
Jun. 15, 2000
John D. Mize, Spokane, WA (US);
Russell B. Gore, Spokane, WA (US);
Ronald H. Fleming, Spokane, WA (US);
Honeywell International Inc., Morristown, NJ (US);
Abstract
The invention encompasses a method of generating information about materials in a composition. A reagent is utilized to dissolve portions of the composition, and thereafter is filtered through a substrate which is then scanned with a microscope using automated displacement of the substrate to obtain data about the non-dissolved portions at locations along a grid pattern. Information about the size and quantity of the non-dissolved portions of the composition is generated. The invention also encompasses a method of generating information about impurities present in a metal composition. Metallic portions of the composition are selectively dissolved relative to impurities to form a solution. The solution is filtered through a substrate which is then scanned with a microscope to obtain data about a darkness of the impurities relative to a background. The data is processed to generate information about the size, quantity and type of the impurities.