The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 12, 2004
Filed:
Oct. 23, 2002
Applicant:
Inventors:
Marthinus van Schoor, Medford, MA (US);
Attila Lengyel, Cambridge, MA (US);
Gert Johannes Muller, Norwood, MA (US);
Brooks Radighieri, Sudbury, MA (US);
Assignee:
MIDE Technology, Medford, MA (US);
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01L 5/04 ;
U.S. Cl.
CPC ...
G01L 5/04 ;
Abstract
A method and sheet-like sensor for measuring stress distribution including a grid of members which change in resistance when subjected to strain, the members intersecting at internal nodes and intersecting at boundary nodes at the periphery of the grid defining a plurality of legs. An analyzer is electrically connected only to the boundary nodes and configured to calculate any change in resistance in all of the legs based solely on the measured resistance of the legs between the boundary nodes.