The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 6802034 B1

PDF
Full Text
Expired
Date of Patent:
Oct. 05, 2004

Filed:

Jan. 31, 2002
Applicant:
Inventors:

Yukikazu Matsuo, Hyogo, JP;

Yoshihiro Nagura, Tokyo, JP;

Assignee:

Other;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 1/100 ;
U.S. Cl.
CPC ...
G06F 1/100 ;
Abstract

A test pattern generation circuit for use with a self-diagnostic circuit which produces a test pattern through use of a microinstruction code, which includes a memory device RAM/ROM which temporarily stores the microinstruction code and outputs two different instruction codes within one clock cycle; a selector SEL which receives output from the memory device and selectively delays the two instruction codes, thereby outputting one code; and a pattern generation circuit PG which produces a test pattern corresponding to output from the selector.


Find Patent Forward Citations

Matsuo, Yukikazu. (2004). Test pattern generation circuit and method for use with self-diagnostic circuit (U.S. Patent No. 6802034). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/6802034

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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