The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 05, 2004
Filed:
Mar. 26, 2002
Michel Chretinat, Agnetz, FR;
Heidelberger Druckmaschinen AG, Heidelberg, DE;
Abstract
A method for monitoring processes includes identifying process variables in a process space as operating values, carrying out a measurement of actual values of the operating values, presetting or measuring actual values of at least one operating parameter that influences these operating values, assessing operating values as a function of the operating parameters, and generating a map of the process space by allocating at least one subset of points of the process space to at least two classes which represent a measure of the risk of the operating state of the printing machine. An apparatus for implementing the above-described method has at least one diagnostic apparatus, an input unit, a machine control unit and a display apparatus. The apparatus also has a cartography unit which provides a map of the process space of the operating values as a function of the operating parameters.