The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 05, 2004
Filed:
Jul. 27, 2000
Weiguo Wu, Tokyo, JP;
Teruyuki Ushiro, Chiba, JP;
Takayuki Yoshigahara, Tokyo, JP;
Atsushi Yokoyama, Kanagawa, JP;
Sony Corporation, Tokyo, JP;
Abstract
The invention provides an image processing apparatus and method as well as a medium by which a corresponding point can be found out and matching between images can be performed with a higher degree of accuracy. A template deformation section produces a plurality of deformed templates by linear interpolation from a template inputted thereto from a template setting section and inputs the deformed templates to a plurality of matching operation sections. The matching operation sections use an image of an epipolar line from among reference images stored in image memories and the deformed templates to perform template matching on the epipolar line. Selection sections determine one of the deformed templates which exhibits the highest similarity degree from results of the template matching and determine coordinate values then as a parallax.