The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 05, 2004

Filed:

Apr. 30, 2002
Applicant:
Inventors:

Qiang Fu, Forest Hills, NY (US);

Sergei Petrovich Nikitin, East Setauket, NY (US);

Anatoly Viktorovich Masalov, Troitzk, RU;

Assignee:

Excel/Quantronix, Inc., East Setauket, NY (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01B 9/02 ;
U.S. Cl.
CPC ...
G01B 9/02 ;
Abstract

An apparatus and method to measure optical intensity and phase of one or several light pulses is described. The apparatus combines a spectrally resolved interferometric asymmetric single-shot optical autocorrelator and imaging spectrograph. The asymmetric design of the optical autocorrelator based on second harmonic generation eliminates time-direction ambiguity, while a spectrally resolved interferometric pattern allows the performance of self-check and self-calibration of the apparatus and substantially improves convergence, robustness and reliability of the computational retrieval algorithm.


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