The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 05, 2004

Filed:

Dec. 28, 2000
Applicant:
Inventors:

Jaan Noolandi, Mississauga, CA;

Robert A. Street, Palo Alto, CA (US);

Neville Connell, Alpine, CA (US);

Assignee:

Xerox Corporation, Stamford, CT (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
C12Q 1/68 ; C12P 1/934 ; C12M 1/34 ; C07H 2/102 ; C07H 2/104 ;
U.S. Cl.
CPC ...
C12Q 1/68 ; C12P 1/934 ; C12M 1/34 ; C07H 2/102 ; C07H 2/104 ;
Abstract

An improved method for the sequencing of DNA fragments is provided. The method includes using a known process for DNA fragment separation, such as capillary electrophoresis, and imaging the resultant gel plate with a full-width array scanner or a two-dimensional amorphous silicon image sensor array. The DNA sample is placed within a well of the separation apparatus, such as a capillary tube or plurality thereof. The separation apparatus is then placed in a buffer. An electric field is then applied, forming a bias between the ends along which the sample is separated. Once separated, the large area detector scans the entire gel plate and resultant image data is provided. By way of the improved method, the entire gel plate can be scanned at the same time and repeatedly, resulting in greater accuracy and a shorter time to sequence.


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