The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 28, 2004
Filed:
Feb. 25, 2000
Toshiaki Kirihata, Poughkeepsie, NY (US);
Gerhard Mueller, Meitingen, DE;
David Russell Hanson, Brewster, NY (US);
Infineon Technologies North America Corp, San Jose, CA (US);
Abstract
A method for testing a data path for a semiconductor memory device, in accordance with the present invention, includes providing a semiconductor memory device including a plurality of stages in a data path, and transferring data into the data path. Components are disabled to isolate at least one stage of the plurality of stages such that data written to or read from the at least one stage is available at an output. The data at the output is preferably compared to expected data. Alternately, system level calibration between devices may be performed to ensure proper communication between devices without destroying data in a memory array and making a dynamic data skew calibration possibly while running an application.