The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 28, 2004

Filed:

Jun. 26, 2002
Applicant:
Inventors:

Yoshikatsu Miyao, Tokyo-to, JP;

Masaaki Kobayashi, Tokyo-to, JP;

Masaki Takanashi, Tokyo-to, JP;

Assignee:

Kabushiki Kaisha TOPCON, Tokyo-to, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01B 5/02 ;
U.S. Cl.
CPC ...
G01B 5/02 ;
Abstract

A measuring device, comprising a program for operating the measuring device, a copying program for rewriting the program or for copying the program, a rewritable first storage means for storing the program, a signal input/output means, and a second storage means for storing the copying program, wherein the program stored in the first storage means is rewritten by a new program inputted through the signal input/output means.


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