The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 28, 2004
Filed:
Oct. 31, 2002
Christopher P Duff, Colorado Springs, CO (US);
Marty Grove, Manitou Springs, CO (US);
Allen Montijo, Colorado Springs, CO (US);
Vivian Patlin, Colorado Springs, CO (US);
David Poppe, Colorado Springs, CO (US);
Agilent Technologies, Inc., Palo Alto, CA (US);
Abstract
A measurement system for analyzing data values that are stored in memory and that represent a sampled electrical signal under analysis (SUA). Each of the data values represents the SUA at respective points in time over a time interval during which the SUA was sampled. The stored data values constitute a main data record. The system includes processing logic that is configured to generate at least a first reduced data record from the main data record. The first reduced data record comprises a subset of the data values of the main data record. The first reduced data record is processed by the processing logic to locate an edge (i.e., a voltage transition) in the first reduced data record. Thus, it is not necessary that the main data record, which is more voluminous than the first reduced data record, be used to locate the edge. After the edge has been located, the processing logic processes a second set of data values of the main data record that is within boundaries in the main data record associated with the first reduced data set in order to analyze the edge. Thus, it is not necessary to process the entire main data record in order to analyze, or evaluate, an edge. Once the edge has been suitable located, all of the data of the main data record that is associated with the edge may be processed to analyze the edge.