The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 28, 2004

Filed:

Mar. 28, 2002
Applicant:
Inventors:

Scott William Petrick, Sussex, WI (US);

Rowland Frederick Saunders, Hartland, WI (US);

Richard Gordon Cronce, New Berlin, WI (US);

Jeffrey Alan Kautzer, Pewaukee, WI (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H05G 1/64 ;
U.S. Cl.
CPC ...
H05G 1/64 ;
Abstract

Methods and apparatus are provided in a diagnostic X-ray system for reducing signal conversion time for a solid-state detector panel of the X-ray system in order to increase frame rate. A measurement of a set of induced signal offsets caused by time varying charge retention associated with the detector panel is performed during a phantom time segment prior to normal signal readout of the detector panel for a current image frame. A set of adjustment values is generated in response to the set of induced signal offsets. Subsets of signal values of the detector panel are read out to a pre-determined signal dynamic range as part of normal signal readout of the detector panel in response to the set of adjustment values, thus generating a set of normalized detector signals.


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