The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 28, 2004
Filed:
May. 17, 2000
Applicant:
Inventors:
Jiang Hsieh, Brookfield, WI (US);
Idris A. Elbakri, Ann Arbor, MI (US);
Assignee:
GE Medical Systems Global Technology Company, LLC, Waukesha, WI (US);
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
A61B 6/00 ; G01N 2/300 ; G21K 1/12 ; H05G 1/60 ;
U.S. Cl.
CPC ...
A61B 6/00 ; G01N 2/300 ; G21K 1/12 ; H05G 1/60 ;
Abstract
A method for deconvolving imaging data obtained in slices using an imaging system. The method includes steps of selecting a target slice sensitivity profile and determining a deconvolution kernel using the target slice sensitivity profile. This method allows an imaging system user to use singular value decomposition to achieve a desired slice sensitivity profile through imaging data deconvolution. Thus sub-millimeter slice thickness and improved image resolution are achieved without hardware modifications to existing imaging systems.