The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 28, 2004
Filed:
Jun. 27, 2002
Xiaoling Sunney Xie, Lexington, MA (US);
Ji-Xin Cheng, Somerville, MA (US);
President and Fellows of Harvard College, Cambridge, MA (US);
Abstract
Systems and methods are disclosed for detecting a nonlinear coherent field induced in a microscopic sample. The system includes in an embodiment, a first source for generating a first polarized electromagnetic field at a first frequency and a second source for generating a second polarized electromagnetic field at a second frequency that is different from the first frequency. The system further includes optics for combining the first polarized electromagnetic field and the second polarized electromagnetic field in a collinear fashion such that the difference in polarization angles is &phgr; wherein &phgr; is not equal to zero. The optics further direct the combined electromagnetic field toward a common focal volume. The system also includes a polarization sensitive detector for detecting a nonlinear coherent field that is generated responsive to the first and second polarized electromagnetic fields in the focal volume.