The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 28, 2004
Filed:
Feb. 28, 2001
Gisela Meister, Munich, DE;
Albert Mödl, Gersthofen, DE;
Robert Müller, München, DE;
Bruno Struif, Darmstadt, DE;
Dirk Scheuermann, Darmstadt, DE;
Giesecke & Devrient GmbH, Munich, DE;
Abstract
A method and an apparatus for testing a biometric feature wherein a set value of the biometric feature is stored in a data carrier in the form of one or more data records. For testing the biometric feature, measured values representing an instantaneous value of the biometric feature are first determined and made available in a terminal. The data carrier transmits to the terminal at least a subset of first reference values depending on the data record or data records for the set value. The terminal links data derived from the measured values with the subset of first reference values and transmits the result of the link to the data carrier. The data carrier tests the result of the link and determines therefrom whether the biometric feature is authentic.