The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 28, 2004
Filed:
Aug. 16, 2002
Erwin Bayer, Dachau, DE;
Jörg Höschele, Friedrichshafen, DE;
Stefan Schneiderbanger, Lauterbach, DE;
Jürgen Steinwandel, Uhldingen-Mühlhofen, DE;
Other;
Abstract
A method for measuring characteristic properties of a plasma beam in a thermal spraying process, wherein the spraying materials are fed into the plasma ( ) and the luminous radiation emitted by the plasma ( ) is reproduced on optical fibers ( ). The luminous radiation is reproduced on the one end ( ) of the optical fibers ( ) arranged in a one-dimensional or two-dimensional array ( ). Spectral analysis of the luminous radiation transmitted in the optical fiber ( ) is accomplished with a spectrometer ( ) arranged at the other end ( ) of an optical fiber ( ). The frequency spectrums are analyzed in a processor ( ) to determine the contemporaneous condition of the spraying process.