The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 28, 2004
Filed:
Jan. 03, 2002
Jack Stephen Kessler, Mountain Ranch, CA (US);
Jim Tark Chiu, Los Altos, CA (US);
Opto Electronic Systems, Inc., Sunnyvale, CA (US);
Abstract
A testing system includes a device independent handling system utilizing removable collets that are customized for various device configurations and provide unique mechanical, thermal and electrical contact to a device-under-test (DUT) without the use of clamps, screws or traditional means of securing a DUT in a test or burn in fixture. The system is designed for automatically loading and positioning each of a plurality of laser diode sub-assemblies, an optical system for automatically receiving each laser diode subassembly from the handling system and automatically performing one or more tests to measure functionality of each laser diode sub-assembly, a detection system for detecting characteristics associated with one or more tests performed by the optical system for each laser diode sub-assembly, and a control system for automatically receiving detected characteristics from the detection system, comparing the detected characteristics to stored expected characteristics for a properly functioning laser diode sub-assembly, and providing control instructions to the optical system based on the comparison. The one or more tests are performed by automatically positioning a lens such that light generated from the laser diode sub-assembly is formed into laser light, and each test measures a desired characteristic of the laser light.