The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 21, 2004

Filed:

Mar. 04, 2002
Applicant:
Inventors:

Kenneth S. Kump, Waukesha, WI (US);

Francois S. Nicolas, Gif sur Yvette, FR;

Christopher D. Unger, Delafield, WI (US);

Matthew J. Walker, New Berlin, WI (US);

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H05G 1/26 ;
U.S. Cl.
CPC ...
H05G 1/26 ;
Abstract

A method and system for of defining, or identifying, regions of interest for exposure management in a digital x-ray imaging system, and especially in the case of multiple consecutive image acquisitions. According to the most basic embodiment of the present invention, simple geometric shapes arranged in a matrix configuration are used to aid an operator in identifying a region of interest for a diagnostic x-ray image. Each region of interest is selectable from a low-dose preshot image and may be corrected, or processed, in order to enhance the results of a subsequent diagnostic image. The processing of the preshot image allows the system to automatically make predictions for the diagnostic image exposure requirements, thereby avoiding unnecessary multiple images.


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