The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 21, 2004
Filed:
Jul. 16, 2002
Yasushi Ogihara, Yokohama, JP;
Nikon Corporation, Tokyo, JP;
Abstract
A microscope system includes: a stage that shifts a specimen in x and y directions; a detection section that detects a position of the stage after shifting; a reception section that receives an input of a shift target position for the stage inputted by an observer; an optical system that forms a light flux into a focused and magnified image of the specimen; an image capturing section that captures the magnified image; and a shift section that, if the position detected by the detection section and the shift target position received by the reception section do not agree with one another, shifts a relative positional relationship between the light flux and the image capturing section.