The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 21, 2004
Filed:
Jun. 01, 2001
Applicant:
Inventors:
David Dickson Booker, Chicago, IL (US);
Robert E. Fischer, Westlake Village, CA (US);
Michael P. Newell, Thousand Oaks, CA (US);
David W. Kappel, San Diego, CA (US);
Scott Moritz, Villa Park, IL (US);
Jerome E. Oleksy, Park Ridge, IL (US);
Assignee:
Packard Instrument Company, Downers Grove, IL (US);
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 2/125 ; G01J 3/30 ; F21V 9/16 ;
U.S. Cl.
CPC ...
G01N 2/125 ; G01J 3/30 ; F21V 9/16 ;
Abstract
A universal microplate analyzer capable of carrying out measurements on samples contained in the wells of microplates by fluorescence, absorbance, luminescence employs at least two light sources and optical fiber channels for directing excitation light to the sample wells. Flexibility of operation is provided by arrays of mirrors, apertures, and polarizers which can be positioned as required for the analysis to be carried out.