The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 21, 2004
Filed:
Jul. 20, 2001
Clemens Ruck, Bondorf, DE;
Emmerich Mueller, Boeblingen, DE;
Agilent Technologies, Inc., Palo Alto, CA (US);
Abstract
A wavemeter for determining a wavelength of an incoming optical beam. The wavemeter comprises a coarse-measuring unit determining in a first wavelength range a first wavelength value as representing the wavelength of the incoming optical beam, and a fine-measuring unit providing a wavelength determination for the incoming optical beam that is ambiguous within the first wavelength range but unambiguous in each of a plurality of unambiguous wavelength ranges, so that a plurality of different wavelength values correspond to a measuring value as measured by the fine-measuring unit for the incoming optical beam. The wavemeter further comprises an evaluation unit for determining a second wavelength range as the one of the plurality of unambiguous wavelength ranges that covers the first wavelength value, and for determining a second wavelength value as the one of the plurality of different wavelength values that corresponds to the measuring value in the second wavelength range. The second wavelength value is output as measuring result of the wavemeter representing the wavelength of the incoming optical beam.