The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 21, 2004
Filed:
Mar. 15, 2002
Applicant:
Inventor:
Kaoru Uchiyama, Kanagawa, JP;
Assignee:
Fuji Photo Film Co., Ltd., Kanagawa, JP;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G03B 2/752 ; G03B 2/734 ; G03B 2/736 ;
U.S. Cl.
CPC ...
G03B 2/752 ; G03B 2/734 ; G03B 2/736 ;
Abstract
A photographic lens and test chart provide for a method of inspecting and adjusting the focus of the lens. The test chart is obliquely inclined relative to a plane perpendicular to the viewing axis of the photographic lens. Test photographs are taken of the test chart under low magnification and high magnifications the test photographs enabling the photographic lens to be adjusted for proper focus.
Uchiyama, Kaoru. (2004). Focus inspection device and focusing method (U.S. Patent No. 6795165). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/6795165
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile