The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 21, 2004
Filed:
May. 18, 2001
Michael G. Lavelle, Saratoga, CA (US);
Philip C. Leung, Fremont, CA (US);
Yan Y. Tang, Mountain View, CA (US);
Sun Microsystems, Inc., Santa Clara, CA (US);
Abstract
A system and method capable of super-sampling and performing super-sample convolution are disclosed. In one embodiment, the system may comprise a graphics processor, a frame buffer, a sample cache, and a sample-to-pixel calculation unit. The graphics processor may be configured to generate a plurality of samples. The frame buffer, which is coupled to the graphics processor, may be configured to store the samples in a sample buffer. The samples may be positioned according to a regular grid, a perturbed regular grid, or a stochastic grid. The sample-to-pixel calculation unit is programmable to select a variable number of stored samples from the frame buffer, copy the selected samples to a sample cache, and filter a set of the selected samples into an output pixel. The sample-to-pixel calculation unit retains those samples in the sample cache that will be reused in a subsequent pixel calculation and replaces those samples no longer required with new samples for another filter calculation.