The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 21, 2004
Filed:
Sep. 05, 2002
Seiji Toyoda, Tokyo, JP;
Emiko Fujiwara, Tokyo, JP;
Ando Electric Co. Ltd., Tokyo, JP;
Abstract
A phase delay characteristic measuring apparatus includes an in-phase component calculating means for outputting a correlation value between input sampling data of the input signal and the output signal and ideal sine waveform data as a baseband I signal (in-phase component), a quadrature component calculating means for outputting a correlation value between the input sampling data of the input signal and the output signal and ideal cosine waveform data as a baseband Q signal (quadrature component), a phase angle calculating means for outputting phase angles of the input signal and the output signal based on the baseband I signal and the baseband Q signal, and a phase delay calculating means for calculating an amount of phase delay of the tested device from the phase angles of the input signal and the output signal.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile