The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 21, 2004

Filed:

Jan. 23, 2003
Applicant:
Inventors:

Charles William Russ, IV, Sunnyvale, CA (US);

William D. Frazer, Mountain View, CA (US);

Assignee:

Agilent Technologies, Inc., Palo Alto, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H01J 4/940 ;
U.S. Cl.
CPC ...
H01J 4/940 ;
Abstract

A system and method of processing signals generated at a detector of a mass spectrometer prior to signal conversion in which a pre-ADC offset is applied to the signals that is adjustable in polarity and magnitude in accordance with a user-selected mode. According to a first mode, a positive offset is applied to the signals to improve quantitation accuracy and in a second mode, a negative offset is applied to the signals to improve resolution and mass assignment.


Find Patent Forward Citations

Loading…