The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 21, 2004

Filed:

Nov. 15, 2000
Applicant:
Inventors:

Marco Cardillo, Lausanne, CH;

Roland Duteil, Genève, CH;

Assignee:

TESA SA, Renens, CH;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01D 5/34 ;
U.S. Cl.
CPC ...
G01D 5/34 ;
Abstract

The opto-electronic system for dimension-measuring device comprises a transparent rule ( ) comprising at least one portion provided with a succession of opaque graduations ( ), a photo-emitter ( ), a photo-detector ( ), an integrated optical bloc ( ) capable of concentrating the light beam generated by the photo-emitter ( ) on the rule portion, and of concentrating the light beam having crossed said rule ( ) on said photo-detector ( ). The optical bloc ( ), the photo-emitter ( ) and said at least one photo-detector ( ) are mounted on the same printed circuit board ( ). The rule ( ) occupies a plane perpendicular to said printed circuit board ( ). The optical bloc comprises optical surfaces disposed opposite each side of said rule ( ).


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