The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 21, 2004

Filed:

Apr. 18, 2002
Applicant:
Inventor:

Juha Hyyppa, Espoo, FI;

Assignee:

Diware Oy, Espoo, FI;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01B 1/100 ;
U.S. Cl.
CPC ...
G01B 1/100 ;
Abstract

The invention relates to a method for the determination of stand attributes with an instrument above the stand. In the method, three-dimensional information is collected from the stands by using such a number of sample hits, that individual trees or groups of trees can be distinguished. A three-dimensional tree height model is produced from collected information. Stand attributes—which are characteristics of individual trees or groups of trees and/or characteristics derived using these information for larger areas—are determined from the tree height model. The invention also relates to a computer program which can be used to carry out the second and third step of the method.


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