The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 14, 2004
Filed:
Dec. 04, 2002
Adrianus J. Smulders, San Diego, CA (US);
Jim J. Wei, San Diego, CA (US);
Johannes I. Boerhout, San Diego, CA (US);
SKF Condition Monitoring, Inc., San Diego, CA (US);
Abstract
Systems and methods for identifying the presence of a defect in vibrating machinery. An exemplary method comprises analysis of frequency spectrum vibration data of the machine. The method comprises deriving a harmonic activity index based on estimates of the energy associated with the frequency spectrum and the energy associated with the defect's harmonic series. The method may comprise deriving a value K by estimating a value M indicative of the energy of the defect's harmonic series and dividing M by the number of spectral lines corresponding to the defect's harmonic series. The method may further comprise deriving a value R by estimating a value Q indicative of the energy in the frequency spectrum data and dividing Q by the number of spectral lines of the frequency spectrum data. The method further comprises deriving the harmonic activity index based on the estimated K and R. Related systems for executing the methods are also disclosed.