The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 14, 2004
Filed:
May. 06, 2003
Applicant:
Inventor:
Seiichiro Mori, Tochigi, JP;
Assignee:
Canon Kabushiki Kaisha, Tokyo, JP;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G02B 2/608 ;
U.S. Cl.
CPC ...
G02B 2/608 ;
Abstract
In an OFS scanning optical system in which a light beam incident to a deflection surface is set to a light beam wider than the deflection surface, angles formed between the center axes of emitted distributions of light beams from light emitting points of respective lasers as light sources and the optical axis of the corresponding optical system within a main scanning section and total angular widths of laser beam radiation angles within the main scanning section are regulated. Thus, symmetry and uniformity of an illumination distribution of an imaging spot on a surface to be scanned are improved.