The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 14, 2004

Filed:

Jul. 23, 2002
Applicant:
Inventors:

Haiying Huang, Atlanta, GA (US);

Zhi Zhou, Lawrenceville, GA (US);

Harry Douglas Garner, Lawrenceville, GA (US);

Assignee:

Fitel USA Corp., Norcross, GA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 2/100 ;
U.S. Cl.
CPC ...
G01N 2/100 ;
Abstract

A system and method is disclosed for determining information regarding the result of introducing a rotational force on an optical fiber during manufacturing. A rotational deformation of the molten fiber, called spin, is imparted that becomes permanent upon cooling of the fiber. The rotational force also introduces twist on the cooled fiber, which is a non-permanent, mechanical rotation of the fiber. The system and method uses a diameter measuring device that produces a signal corresponding to the fiber's diameter with respect to time. Since the fiber is slightly elliptical in practice, periodic variations in the diameter measurement signal are detected that reflect the rotation imparted into the fiber. The signal is further processed to provide data regarding the effect of the rotations introduced into the fiber, namely the twist and spin present in the fiber.


Find Patent Forward Citations

Huang, Haiying. (2004). System and method for obtaining spin and mechanical twist data during optical fiber draw (U.S. Patent No. 6791678). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/6791678

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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