The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 14, 2004
Filed:
Aug. 26, 2002
Akira Kawai, Sagamihara, JP;
Koji Katayama, Yamato, JP;
Toru Futami, Yokohama, JP;
Tomoyuki Oikawa, Zama, JP;
Keiichiro Nishizawa, Yokohama, JP;
Tosoh Corporation, Shinnanyo, JP;
Abstract
An information measuring apparatus having a fine channel device comprises at least one detector for measuring information supplied from a plurality of measuring portions formed in the fine channel device, a position-holding/determining means for holding and positioning the fine channel device, a rotating means for rotating the fine channel device at a predetermined angle, a position-determining means for positioning the measuring portion and the detector, wherein information supplied from the measuring portions in the fine channel device is measured successively by rotating the fine channel device at the predetermined angle, whereby information from the measuring portions is stably and efficiently measured.