The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 14, 2004
Filed:
Jul. 18, 2003
Bumha Lee, Sunnyvale, CA (US);
Brian D. Segerstedt, Redwood City, CA (US);
Christina P. Phan, San Jose, CA (US);
National Semiconductor Corporation, Santa Clara, CA (US);
Abstract
A method and apparatus for system offset calibration using an overranging ADC is provided. The overranging ADC is configured to convert an analog signal into an intermediary digital signal. The conversion range of the overranging ADC is extended beyond the full dynamic range of the ADC system. The intermediary digital signal has more bits than the digital output signal. A digital fine offset adjustment circuit is configured to provide the digital output signal by digitally subtracting a fine offset from the intermediary digital signal and decoding the intermediary digital signal. The digital output signal has approximately no offset, and has approximately no loss in dynamic range.