The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 14, 2004
Filed:
Oct. 04, 2001
Applicant:
Inventors:
Tomotaka Yokoyama, Shinjuku-ku, JP;
Takemi Miyamoto, Shinjuku-ku, JP;
Hiroshi Tomiyasu, Shinjuku-ku, JP;
Kouji Takahashi, Shinjuku-ku, JP;
Assignee:
Hoya Corporation, Tokyo, JP;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G11B 5/66 ;
U.S. Cl.
CPC ...
G11B 5/66 ;
Abstract
A substrate for an information recording medium, wherein the period of microwaviness is 2 &mgr;m to 4 mm, and if we let wa be the maximum height of this microwaviness and Rmax be the maximum height measured by atomic force microscope, the main surface of the substrate has a wa of no more than 5 nm and an Rmax of no more than 12 nm, provided that wa is the difference between the highest and lowest points on a measurement curve of all measured points in a measurement area.