The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 14, 2004
Filed:
Oct. 05, 2001
Kabushiki Kaisha TOPCON, Tokyo-to, JP;
Abstract
The eye's optical characteristic measuring system of the present invention comprises a projection system for projecting a primary index image on fundus of an eye under testing, a photodetection system for forming a secondary index image on a photoelectric detector from a reflection light beam of the primary index image, detection systems and for measuring a light amount intensity distribution characteristic of the secondary index image based on a signal from the photoelectric detector, a correction optical system arranged in an optical path shared in common with the photodetection system and the detection system and for focusing the primary index image on the fundus of the eye under testing in corrected condition according to ocular refractive characteristic of the eye under testing, and a light beam switching means for switching over to a first condition to guide the reflection light beam including the scattering reflection light beam from the fundus of the eye under testing to the photoelectric detector and to a second condition to guide only the totally reflected light beam from the fundus of the eye under testing to the photoelectric detector, wherein the system is designed in such manner that light amount intensity distribution characteristics of the secondary index images formed respectively by two light beams selected by the light beam switching means can be measured based on signals from the photoelectric detector under the condition corrected by the correction optical system.