The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 14, 2004
Filed:
May. 27, 2003
Nobuhiko Nishimura, Nagasaki, JP;
Keiichi Iwamoto, Nagasaki, JP;
Masafumi Yamauchi, Nagasaki, JP;
Takumi Tokiyoshi, Nagasaki, JP;
Takao Hashimoto, Nagasaki, JP;
Masaaki Fujita, Tokyo, JP;
Toshihiko Imamoto, Tokyo, JP;
Mitsubishi Heavy Industries, Ltd., Tokyo, JP;
Abstract
A damage evaluation method and apparatus of a metal material which is capable of determining whether a flaw in the metal sample is originated by the creep damage or in the manufacturing process, and also capable of estimating a remaining life of the metal component. The damage evaluation method of a metal material by the present invention is a method for evaluating a flaw in the metal sample comprising the steps of mounting onto a metal surface including an internal flaw and on both sides of the flaw a transmitting probe for transmitting an ultrasonic waves and a receiving probe for receiving the ultrasonic waves, transmitting the ultrasonic waves towards the internal flaw and receiving the diffracted wave from the flaw for determining whether or not a flaw is present in the metal, based on the analysis of the distribution of the diffracted waves and an analysis of the sample as to whether voids (creep voids) are present and, if present, the distribution of the voids.