The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 14, 2004
Filed:
Aug. 22, 2003
Roland Roth, Waldstetten, DE;
Karl Seitz, Oberkochen, DE;
Kurt Brenner, Satteldorf, DE;
Uwe Brand, Isernhagen, DE;
Wolfgang Hoffmann, Bergfeld, DE;
Thomas Kleine-Besten, Braunschweig, DE;
Sebastian Bütefisch, Braunschweig, DE;
Stephanus Büttgenbach, Sickte, DE;
Carl Zeiss Industrielle Messtechnik GmbH, Oberkochen, DE;
Abstract
A touch probe for a coordinate measuring apparatus is proposed which includes a touch probe chassis adapted to be attached to the coordinate measuring apparatus, a support for the sensing stylus which is mounted on the touch probe chassis so as to be deflectable from a rest position and on which a sensing stylus is mountable for contacting a workpiece , a deflection measuring system for detecting a deflection of the support for the sensing stylus with respect to the touch probe chassis and an inspection optics for inspecting a tip of the sensing stylus . The touch probe is characterized in that at least one of the components support for the sensing stylus and touch probe chassis comprises a transverse support which extends transversely to a direction of extension of the sensing stylus and which is transparent to light in at least a portion thereof and which is disposed in a beam path of the inspection optics