The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 07, 2004
Filed:
Aug. 03, 2001
Friedrich Hapke, Winsen/Luhe, DE;
Koninklijke Philips Electronics N.V., Eindhoven, NL;
Abstract
In an integrated circuit comprising an application circuit ( ) to be tested and a self-test circuit ( - ) which is provided for testing the application circuit ( ) and comprises an arrangement ( - ) for generating deterministic test samples which are applied to the application circuit ( ) for test purposes, the output signals occurring due to the application circuit ( ) in dependence upon the test samples being evaluated by means of a signature register ( ), an unlimited ON-chip testing possibility of the integrated circuit without additional circuit elements in the application circuit ( ) is ensured for test purposes in that the self-test circuit ( - ) comprises a masking logic element ( ) which, during testing, blocks those bits of the output signals of the application circuit ( ) which, based on the circuit structure of the application circuit ( ), have undefined states and applies only the other bits to the signature register ( ).